You are here

Silicon Drift Detectors

  • SDD - XDXL

Involved researchers

SRS is actively engaged in the development of Silicon Drift Detectors (SDD), a relatively recent detector characterized by a very low electronic noise. The SDD is based on a thick (>300 um), high resistivity, silicon substrate, which is fully depleted at the operating voltage, for maximizing the detection efficiency of "hard" X-rays.

The SDD is currently used for state-of-the-art X-ray spectroscopy. It is also employed in Gamma-ray spectroscopy, for the readout of the scintillation light, especially when large photo-senitive areas need to be readout by a solid state detector.